Oxidative and tribological properties of amorphous and quasicrystalline approximant Al-Cu-Fe thin films.

نویسندگان

  • D M Rampulla
  • C M Mancinelli
  • I F Brunell
  • A J Gellman
چکیده

The origins of the tribological properties and corrosion resistance of amorphous and quasicrystalline approximant alloys have been studied by comparing their properties in thin Al-Cu-Fe alloy films with compositions lying near the quasicrystalline region of the ternary compositional phase diagram. Six sputtered thin films of an Al-Cu-Fe alloy were studied using X-ray diffraction, X-ray photoemission spectroscopy (XPS), and an in situ ultrahigh vacuum (UHV) tribometer. The films were annealed in UHV to induce the formation of orthorhombic, rhombohedral, and amorphous bulk structures. The properties of these thin films were then determined in the same UHV apparatus without exposing the films to air. The rates of surface oxidation by H2O and O2 were measured using XPS. Although the oxidation rates and oxide thicknesses were dependent on the oxidant, they were not sensitive to the structures of the films. Friction was measured between identical samples in sliding contact. The friction coefficients (micros = 0.36 +/- 0.11 to 0.56 +/- 0.08) were comparable to those observed in other experiments using quasicrystals and approximants in UHV; however, there was no strong correlation between the friction coefficients and either the film structure or the degree of surface oxidation. These results suggest that the tribological and corrosion resistance properties of these quasicrystalline approximant alloys are not directly connected to crystalline structure.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

In situ studies of magnetron sputtered Al–Cu–Fe–Cr quasicrystalline thin films

In situ studies have been performed on thin films in the Al rich region of the Al–Cu–Fe–Cr quasicrystalline phase field. Thin films were grown by magnetron sputtering on atomically flat MgO (0 0 1) and Al O (0 0 0 1) and subsequently studied by 2 3 transmission electron microscopy and X-ray photoelectron spectroscopy. High resolution electron microscopy shows that thin films (-30 nm) grown at r...

متن کامل

Formation of alpha-approximant and quasicrystalline Al-Cu-Fe thin films

Multilayered Al/Cu/Fe thin films have been deposited by magnetron sputtering onto Si and Al2O3 substrates with a nominal global composition corresponding to the quasicrystalline phase, 5:2:1. Subsequent annealing was performed on samples up to 710 °C. It is found that when using Si as substrate a film-substrate reaction occurs already below 390 °C, where Si diffuses into the film. This changes ...

متن کامل

Microstructural evolution in Al–Cu–Fe quasicrystalline thin films

Transmission electron microscopy (TEM) was performed to study the microstructural evolution in Al–Cu–Fe quasicrystalline thin films. Thin films were grown by magnetron sputtering on sodium chloride crystals, which were subsequently dissolved in water to acquire free-standing films. Studies were conducted on the as-deposited sample, and samples that were annealed at 400 8C in Argon and 500 8C in...

متن کامل

Stable Quasicrystalline Phase in Al-Cu-Fe-Cr Coating Materials

Transmission electron microscopy (TEM) studies have been carried out on magnetron-sputtered coatings in the Al-rich region of the Al-Cu-Fe-Cr quasicrystalline phase field, focusing on the composition that exhibited the best tribological performance among a group of sputtered coatings. The size of the particles in the as-deposited coating is around 10 nm. The TEM experiments on annealed coatings...

متن کامل

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Langmuir : the ACS journal of surfaces and colloids

دوره 21 10  شماره 

صفحات  -

تاریخ انتشار 2005